Test

A Complete Test Engineering Solution

Open-Silicon views test engineering as an essential part of the design process, so we address test very early in the design cycle. Our test engineers have extensive design for testability (DFT) experience with a variety of automatic test equipment (ATE). This allows us to create a smooth transition from a simulation environment to a tester environment, thus avoiding getting stuck in endless loops while debugging test vectors. 

Open-Silicon's test engineering capabilities include:

  • Ultra low-cost digital test
  • High-performance digital test including high speed interfaces
  • Analog and mixed-signal test
  • RF test

 

Collaboration for Best Results

Open-Silicon works with multiple on shore and off shore vendors to gain the benefits of fast local device test bring-up and ultra-low production costs.  Open-Silicon also has a team in Kaohsiung, Taiwan, to directly support the offshoring of test programs for high-volume production.  The test engineering team has experience with several test platforms. In addition to traditional ATPG, advanced DFT techniques such as memory and logic built-in self-test (BIST) and boundary scan are also part of our normal test flow.

We work closely with our customers to perform any special functional vectors that may be required and provide vectors guidelines and test vector playback capabilities which minimize tester debugging time and save customer money. We also provide our customers with a test plan that will satisfy fault coverage requirements.  Open-Silicon's experienced engineers will determine the most cost-effective production tester based on the required pin count, speed, and nature of the design.