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Test

Test - A Holistic View

Open-Silicon views test engineering as an essential part of the design process so we address test very early in the design cycle. Our test engineers have experience in both DFT and ATE equipment. This allows us to create a smooth transition from simulation environment to tester environment, thus avoiding the endless loop of debugging test vectors.

We work with multiple vendors and have experience with several test platforms. In addition to traditional ATPG, advanced DFT techniques such as memory and logic built-in self-test (BIST) and boundary scan are part of our normal test flow.

We work closely with our customers to perform any special functional vectors that may be required and provide vectors guidelines and test vector playback capabilities which minimize tester debugging time and saves the customer money. We also provide our customers with a test plan that will satisfy fault coverage requirements.

Open-Silicon's experienced engineers will determine the most cost-effective production tester based on the required pin count, speed, and nature of the design.